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(January 31, 2008) OXON, U.K. — Oxford Instruments Analytical Limited, a subsidiary of Oxford Instruments plc, released the X-Strata980 X-ray fluorescence (XRF) analyzer. The tool uses a high-power X-ray tube and large LN2 free detector to measure small areas on complex samples. Empirical and fundamental parameter calibration options enable set data analysis or element identification.
The analyzer suits hazardous substance inspection for RoHS and other environmental legislation, analysis and characterization of multi-layer coatings, alloy identification, and plating thickness measurements for gold and other metals. Its detection limits are in single-digit parts per million (ppm). A large detector is said to enable increased count rate for faster analysis.
Five primary filters selectively excite elements of interest on features as small as 150 µm. Empirical calibration suits known element range and matrix; fundamental parameters use a full-spectrum database for quantitative analysis. Large area analysis is performed in one measurement cycle.
The mapping function, with color codes, uses embedded camera and video imaging for sample selection. Statistical data functions and reporting enable legislation-required documentation, or pass/fail information. The user interface is available in nine languages.
For more information, visit www.oxford-instruments.com.
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