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(March 14, 2008) WILMINGTON, Mass. — Textron Defense Systems will host an SMTA technical presentation, "Understanding and Effectively Using XRF Technology for Components and Materials Inspection," including XRF demo, definition of capabilities, and an SMT facility and product showcase tour. Attendance is limited to the first 70 registrants.
Gary Efronson of Fischer Technology will present, covering how X-ray fluorescence (XRF) works and the technologies available (Si/Li detectors, Si-PIN photodiode, and proportional counters), advantages and disadvantages of different technologies and systems, effective applications, and case studies. There will be a live demo of Fischer's benchtop XRF equipment using pin diode technology. Attendees also will tour Textron.
Efronson holds a bachelor's degree in environmental sciences from Michigan State University. He has been in the plating and metal analysis industry for over 25 years. He's been with Fischer Technology for five years.
Attendees must be U.S. citizens due to company regulations. A passport or birth certificate is necessary. RSVP to Mike Sivigny at smta@cetaq-americas.com by Friday, March 21, listing number of attendees and the company name in the subject line.
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