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(April 21, 2008) BOXBOROUGH, Mass. — The SMTA's Boston chapter will bring together presenters from various inspection companies to discuss handheld X-ray fluorescence (XRF) devices at its meeting in Boxborough, Tuesday, April 22. The technical presentation, "Understanding and Effectively Using Handheld XRF Technology for Components and Materials Inspection," will include information on WEEE and RoHS substance levels, speed and accuracy of analyses, and system features.
Speakers from Innov-X Systems, Inc., Oxford Instruments Industrial Analysis,
RMD, Inc., and Thermo NITON will present. Topics include how handheld XRF technology works; how to appropriately screen typical RoHS samples, averaging multiple measurements; WEEE and RoHS substance/materials levels; XRF scanning of entire assemblies versus spot scanning; speed/accuracy of analysis, different system's specific features and testing results display and data export capabilities. The speakers also will cover calibration methods and number of elements that can be quantified in standard calibrations, suggested measurement times and detection limits at those times for plastic and metal matrix, relating the RoHS directive guidelines to XRF analysis, verifying instrument results and calibrations and conformance to IEC 632321, where an XRF system fits in the supply chain, and a review of customers using these devices and ways in which it has helped them.
RSVP to Mike Sivigny at smta@cetaq-americas.com by Monday, April 21. In the e-mail's subject line list the number of attendees and the name of your company. If you make a reservation and can't come, let the SMTA Boston know by early Tuesday, April 22.
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